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13104709993
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真(zhen)理光學儀器有(you)(you)(you)限(xian)公司(si)專注于Gao端(duan)顆粒表(biao)征儀器的研發和(he)制(zhi)造，產(chan)(chan)品涵蓋(gai)激(ji)光（衍射(she)(she)法）粒度分析儀、動態(tai)光散射(she)(she)納(na)米(mi)粒度及Zeta電(dian)位分析儀以及顆粒圖(tu)像分析儀，既有(you)(you)(you)實驗室(shi)儀器，又有(you)(you)(you)在線檢測(ce)系統。真(zhen)理光學秉持(chi)“科學態(tai)度，工(gong)匠精神(shen)”，為用戶提供世界Xian進的Gao端(duan)產(chan)(chan)品和(he)服務。
真理(li)光學(xue)匯集了以(yi)張福(fu)根(gen)(gen)博(bo)(bo)(bo)士(shi)為代表的全(quan)國顆(ke)粒表征領域的頂尖人才。張福(fu)根(gen)(gen)博(bo)(bo)(bo)士(shi)現任本公(gong)(gong)司(si)(si)董事長(chang)兼(jian)首Xi科(ke)學(xue)家，還擔任全(quan)國顆(ke)粒表征及分檢與篩網標準化技(ji)術委(wei)員(yuan)會副主(zhu)任委(wei)員(yuan)、天津大學(xue)兼(jian)職教授，曾擔任中(zhong)國顆(ke)粒學(xue)會副理(li)事長(chang)，同時(shi)也是(shi)“歐美克(ke)”字號公(gong)(gong)司(si)(si)的創始人。曾擔任英國某(mou)粒度儀器公(gong)(gong)司(si)(si)中(zhong)國總經理(li)20余(yu)年(nian)的秦和義先生擔任本公(gong)(gong)司(si)(si)商務總經理(li)，中(zhong)國顆(ke)粒學(xue)會青年(nian)理(li)事潘(pan)林超(chao)博(bo)(bo)(bo)士(shi)、陳(chen)進(jin)博(bo)(bo)(bo)士(shi)擔綱公(gong)(gong)司(si)(si)的研(yan)發主(zhu)力。
激光（衍(yan)射(she)(she)(she)法(fa)(fa)）粒(li)度(du)(du)儀(yi)雖然已得到廣(guang)泛應用，但(dan)它并(bing)不(bu)(bu)Wan美，不(bu)(bu)論是科學基礎方(fang)(fang)面，還是技(ji)術(shu)方(fang)(fang)案(an)方(fang)(fang)面。真理(li)光學的(de)(de)(de)(de)團(tuan)隊(dui)針對(dui)(dui)當前市(shi)面上儀(yi)器存在的(de)(de)(de)(de)不(bu)(bu)足，展開了(le)(le)系統(tong)的(de)(de)(de)(de)理(li)論研(yan)究和技(ji)術(shu)創新，發現了(le)(le)衍(yan)射(she)(she)(she)光斑（愛里(li)斑）的(de)(de)(de)(de)反(fan)常(chang)變化現象（ACAD），解(jie)釋(shi)了(le)(le)為什么不(bu)(bu)能測(ce)(ce)量(liang)3μm左右的(de)(de)(de)(de)聚(ju)苯乙烯(xi)微(wei)球，并(bing)給(gei)出(chu)(chu)(chu)了(le)(le)反(fan)常(chang)區(qu)（不(bu)(bu)能測(ce)(ce)量(liang)粒(li)徑）的(de)(de)(de)(de)一(yi)般公式(shi)；研(yan)究了(le)(le)衍(yan)射(she)(she)(she)儀(yi)器的(de)(de)(de)(de)測(ce)(ce)量(liang)上限和下限；研(yan)究了(le)(le)顆粒(li)折(zhe)射(she)(she)(she)率(lv)偏(pian)差對(dui)(dui)測(ce)(ce)量(liang)結果的(de)(de)(de)(de)影響，發明了(le)(le)兩種根據(ju)散射(she)(she)(she)光分布估算顆粒(li)折(zhe)射(she)(she)(she)率(lv)的(de)(de)(de)(de)方(fang)(fang)法(fa)(fa);提出(chu)(chu)(chu)了(le)(le)斜(xie)置梯形(xing)窗口技(ji)術(shu)方(fang)(fang)案(an)（Zhuan利），解(jie)決了(le)(le)前向超大角測(ce)(ce)量(liang)盲區(qu)的(de)(de)(de)(de)問題，使衍(yan)射(she)(she)(she)儀(yi)器的(de)(de)(de)(de)亞微(wei)米顆粒(li)測(ce)(ce)量(liang)水平顯(xian)著提高(gao);提出(chu)(chu)(chu)了(le)(le)統(tong)一(yi)的(de)(de)(de)(de)反(fan)演算法(fa)(fa)（專(zhuan)有技(ji)術(shu)），消除了(le)(le)不(bu)(bu)同計(ji)算模式(shi)給(gei)出(chu)(chu)(chu)不(bu)(bu)同結果的(de)(de)(de)(de)尷尬(ga)；設計(ji)出(chu)(chu)(chu)了(le)(le)高(gao)達20Kfps的(de)(de)(de)(de)超高(gao)速(su)并(bing)行(xing)數據(ju)采(cai)樣電路，使干法(fa)(fa)測(ce)(ce)量(liang)的(de)(de)(de)(de)精度(du)(du)不(bu)(bu)亞于濕(shi)法(fa)(fa)測(ce)(ce)量(liang)，對(dui)(dui)高(gao)速(su)噴霧場(chang)的(de)(de)(de)(de)測(ce)(ce)量(liang)（時間）分辨率(lv)也(ye)更(geng)高(gao)。
在納米粒(li)度及Zeta電(dian)位(wei)儀方(fang)面，真(zhen)理光(guang)學提(ti)出了(le)比相位(wei)分(fen)析(xi)法（PALS）更先進的(de)(de)余弦擬合相位(wei)分(fen)析(xi)法（CF-PALS），用光(guang)纖(xian)(xian)分(fen)束(shu)取(qu)代了(le)傳統的(de)(de)平板分(fen)束(shu)鏡分(fen)束(shu)，用光(guang)纖(xian)(xian)內光(guang)干(gan)涉(she)取(qu)代了(le)自(zi)由空間干(gan)涉(she)，使Zeta電(dian)位(wei)的(de)(de)測量重復性大幅度提(ti)高。
Linkoptik Instruments specializes in the development and manufacture of high-end particle characterization instruments, including laser (diffraction) particle size analyzers, dynamic light scattering nano particle size and zeta potential analyzers, and particle image analyzers, both laboratory instruments and online inspection systems. Linkoptik Instruments upholds the "scientific attitude and craftsmanship" to provide customers with the world's advanced high-end products and services.
Linkoptik Instruments has gathered the top talents in the field of particle characterization in China, represented by Dr. Fugen Zhang. Dr. Zhang is the Chairman and Chief Scientist of our company, and is also the Vice Chairman of the National Technical Committee for Particle Characterization and Sieving and Sieve Standardization, a part-time professor of Tianjin University, and the Vice Chairman of the Chinese Particle Society. Mr. Qin He Yi, who was the general manager of a particle size instrument company in China for more than 20 years, is the commercial general manager of the company, and Dr. Pan Linchao and Dr. Chen Jin, the young directors of the Chinese Particle Society, are the main R&D team of the company.
Although laser (diffraction) particle size measurement has been widely used, it is not perfect, both in terms of scientific basis and technical solutions. The team at Truth Optics has conducted systematic theoretical research and technological innovation to address the shortcomings of the current instruments on the market, discovered the phenomenon of anomalous variation of diffraction spot (Airy spot) (ACAD), explained why polystyrene microspheres around 3 μm cannot be measured, and gave a general formula for the anomalous zone (not measuring particle size); studied the upper and lower measurement limits of diffraction instruments; studied the effect of particle The influence of refractive index deviation on the measurement results was studied, and two methods for estimating the refractive index of particles based on the scattered light distribution were invented; an oblique trapezoidal window technical solution (patented) was proposed, which solved the problem of the blind area of the forward oversized angle measurement and significantly improved the submicron particle measurement level of the diffraction instrument; a unified inversion algorithm (proprietary technology) was proposed, which eliminated the embarrassment of different calculation modes giving different results; the design of The ultra-high speed parallel data sampling circuit of up to 20Kfps has been designed, which makes the accuracy of dry measurement no less than that of wet measurement, and the measurement (time) resolution of high-speed spray field is also higher.
In nanometer particle size and zeta potential measurement, Linkoptik Instruments has proposed a more advanced cosine fitted phase analysis method (CF-PALS) than PALS, replacing the traditional flat beam splitter mirror beam splitting with fiber optic beam splitting, and replacing free space interference with optical interference inside the fiber, which has greatly improved the repeatability of zeta potential measurement.
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